CNN to classify images of WM-811k data
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Updated
Aug 12, 2022 - Jupyter Notebook
CNN to classify images of WM-811k data
This is a neural network designed to classify wafer imperfections without feature engineering.
MLP to classify images of WM-811k data
DCGAN to generate synthetic images of WM-811k data
Classification of wafer defect map patterns
We use MixedWM38, the mixed-type wafer defect pattern dataset for wafer defect pattern regcognition with visual transformers.
A d3.js wafer map in a react component
Pattern classification on wafer maps
a kibana plugin to visualize the wafer map
STDF to Wafer Bin Map utility written in Python
Shot & Wafer map for semiconductor
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